“電遷移”造句
電遷移擴散是毛細管電泳中影響區帶展寬的重要岡素之一.
Electromigration dispersion ( EMD ) is one of major effects on zone broadening in capillary electrophoresis.
另一方面, 電源網絡上的大電流也可能導致芯片的
電遷移失效.
On the other hand, high supply flowing through the power grids may cause electromigration failures.
本文用測量電阻變化的方法,研究了Al-Si ( 1% ) 金屬化線條的
電遷移失效.
The method of measuring metal stripresistance was used to investigate the elec - tromigration failure of Al - Si ( 1 % ) metalliza - tion.